Thermal property measuring techniques of thin-film heat flux sensors based on pulse-heating method

The thermal property measurement of thin-film heat flux sensors with high precision is very important to reduce the uncertainty of heat flow tests in shock tunnels. As the integrating sphere can gather the reflection laser with high uniformity, a method of direct calibration of thermal parameters is proposed, which adopts heating the substrate surface of the thin-film heat flux sensor by using a pulse heating device. Consequently, a pulse heating device is developed, and its components and working principle are also introduced in details. The pulse heating device can preferably simulate the heating process of the thin-film heat flux sensor in the impulse wind tunnel, and accurately calibrate the heat flow value and the thermal parameters. The results indicate that, the pulse heating device has the advantages of convenient operation, simple sample preparation and high accuracy, and can also preferably simulate the environment that the thin-film heat flux sensor experienced in the impulse wind tunnel, thus reducing the uncertainty of the heat flow test.