Thermal property measuring techniques of thin-film heat flux sensors based on pulse-heating method
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摘要: 在激波风洞测热试验中,高精度的薄膜热流传感器热物性参数对于提高热流测量精度十分重要。利用积分球能收集反射光能、其反射光具有高均匀性的特性,提出了基于脉冲加热装置测量薄膜热流传感器表面、直接标定热物性参数的方法。基于该方法,搭建了用于测量薄膜热流传感器基底材料热物性参数的脉冲加热装置,并详细介绍了测量装置的系统组成和工作原理。该脉冲加热装置能够较好地模拟脉冲型风洞中薄膜热流传感器被加热的过程,可以精确标定热流值和薄膜热流传感器基底材料的热物性参数。研究结果表明:研制的脉冲加热测量装置具有操作便捷、试样制备简单和标定精度高等优点,其加热方式为瞬态加热,能较好地模拟传感器在脉冲型风洞中的使用环境,可以提高脉冲风洞中热流测量结果的精度。Abstract: The thermal property measurement of thin-film heat flux sensors with high precision is very important to reduce the uncertainty of heat flow tests in shock tunnels. As the integrating sphere can gather the reflection laser with high uniformity, a method of direct calibration of thermal parameters is proposed, which adopts heating the substrate surface of the thin-film heat flux sensor by using a pulse heating device. Consequently, a pulse heating device is developed, and its components and working principle are also introduced in details. The pulse heating device can preferably simulate the heating process of the thin-film heat flux sensor in the impulse wind tunnel, and accurately calibrate the heat flow value and the thermal parameters. The results indicate that, the pulse heating device has the advantages of convenient operation, simple sample preparation and high accuracy, and can also preferably simulate the environment that the thin-film heat flux sensor experienced in the impulse wind tunnel, thus reducing the uncertainty of the heat flow test.
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表 1 薄膜热流传感器基底材料热物性参数测量结果
Table 1 Thermal parameters measurement results of a thin-film heat flux sensor
陶瓷基底 E1/mJ Ein/mJ E2/mJ E余/mJ Ex/mJ 激光吸收率 热流值/(W·cm-2) 热流值不确定度 平均值 不确定度1# 34.5 29.032 0.193 11.271 17.761 0.612 141.3 4.8% 2420.9 2447.2 4.2% 2# 33.0 27.770 0.178 10.395 17.374 0.626 138.3 2436.4 3# 34.2 28.779 0.184 10.746 18.034 0.627 143.5 2464.0 4# 33.9 28.527 0.182 10.629 17.898 0.627 142.4 2467.5 -
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